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dc.contributor.authorAlfaro, Sadek Crisóstomo Absi-
dc.contributor.authorBebiano, Daniel Flávio Vidal-
dc.date.accessioned2012-10-02T18:46:52Z-
dc.date.available2012-10-02T18:46:52Z-
dc.date.issued2009-04-
dc.identifier.citationALFARO, Sadek Crisóstomo Absi; BEBIANO, Daniel. A weld defects detection system based on a spectrometer. Sensors, v. 9, n. 4, p. 2851-2861, abr. 2009. Disponível em:<http://www.mdpi.com/1424-8220/9/4/2851?>. Acesso em: 28 set. 2012.en
dc.identifier.urihttp://repositorio.unb.br/handle/10482/11342-
dc.description.abstractImproved product quality and production methods, and decreased production costs are important objectives of industries. Welding processes are part of this goal. There are many studies about monitoring and controlling welding process. This work presents a non-intrusive on-line monitoriment system and some algorithms capable of detecting GTAW weld defects. Some experiments were made to simulate weld defects by disturbing the electric arc. The data comes from a spectrometer which captures perturbations on the electric arc by the radiation emission of chosen lines. Algorithms based on change detection methods are used to indicate the presence and localization of those defects.en
dc.language.isoInglêsen
dc.publisherMDPIen
dc.rightsAcesso Abertoen
dc.titleA weld defects detection system based on a spectrometeren
dc.typeArtigoen
dc.subject.keywordAnálise espectralen
dc.subject.keywordSoldagemen
dc.subject.keywordSolda e soldagemen
dc.subject.keywordSoldagem elétricaen
dc.rights.licenseAll articles published by MDPI are made available under an open access license worldwide immediately. This means: everyone has free and unlimited access to the full-text of all articles published in MDPI journals, and everyone is free to re-use the published material given proper accreditation/citation of the original publication, open access publication is supported by authors' institutes or research funding agency by payment of a comparatively low Article Processing Charge (APC) for accepted articles. Fonte: http://www.mdpi.com/about/openaccess. Acesso em: 28 set. 2012.en
dc.identifier.doihttps://dx.doi.org/10.3390/s90402851en
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